@article{1188,
  keywords = {coefficient of performance, Contact resistance, Cooling, Cryogenics [A0720M], Current density, electrical current density, Fermi-Dirac statistics, Fermion systems, Other direct energy conversion [B8460], Refrigeration, SiGeC-Si, solid-state thermionic refrigeration, Thermionic conversion, Thermionic conversion [A8630N], thermionic emission coolers, thermionic emission cooling},
  author = {M. Ulrich and Peter Barnes and Cronin Vining},
  title = {Effect of contact resistance in solid-state thermionic refrigeration},
  abstract = {<p>An analytical model of thermionic emission cooling that includes contact resistance is presented. The electrical current density necessary for peak operation of thermionic emission coolers is such that even the slightest resistance in the contacts to the devices will significantly reduce the cooling and coefficient of the performance. The effect of contact resistance is analyzed numerically using a model of thermionic emission cooling based on Fermi-Dirac statistics. The cooling and coefficient of performance are shown to be reduced dramatically by even the slightest contact resistance. (C) 2002 American Institute of Physics.</p>
},
  year = {2002},
  journal = {Journal of Applied Physics},
  volume = {92},
  pages = {245-247, },
  month = {2002/07/01/},
  url = {http://cvining.com/system/files/articles/vining/Ulrich-JAP-2002.pdf},
  doi = {10.1063/1.1481777},
  language = {eng},
}