| Title | Effect of contact resistance in solid-state thermionic refrigeration |
| Publication Type | Journal Article |
| Year of Publication | 2002 |
| Authors | Ulrich, M. D., P. A. Barnes, and C. B. Vining |
| Journal Title | Journal of Applied Physics |
| Volume | 92 |
| Issue | 1 |
| Pages | 245-247 |
| Journal Date | Jul 1 |
| Accession Number | ISI:000176314800040 |
| Keywords | coefficient of performance, Contact resistance, Contact resistance, contact potential, and work functions [A7340C], Cooling, Cryogenics [A0720M], Current density, electrical current density, Fermi-Dirac statistics, Fermion systems, Other direct energy conversion [B8460], Refrigeration, SiGeC-Si, solid-state thermionic refrigeration, Thermionic conversion, Thermionic conversion [A8630N], thermionic emission coolers, thermionic emission cooling |
| Abstract | An analytical model of thermionic emission cooling that includes contact resistance is presented. The electrical current density necessary for peak operation of thermionic emission coolers is such that even the slightest resistance in the contacts to the devices will significantly reduce the cooling and coefficient of the performance. The effect of contact resistance is analyzed numerically using a model of thermionic emission cooling based on Fermi-Dirac statistics. The cooling and coefficient of performance are shown to be reduced dramatically by even the slightest contact resistance. (C) 2002 American Institute of Physics. |
http://cvining.com/system/files/articles/vining/Ulrich-JAP-2002.pdf | |
| Citation Key | ulrich2002-1 |
| Full Text |
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